Focused ion beam (FIB) in situ lift-out (INLO) technique showing

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Kleindiek Nanotechnik: TEM sample preparation

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

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An improved FIB sample preparation technique for site-specific

Electronics] Automated Micro-sampling (FIB in-situ lift out)

Figure 2 from Focused ion beam (FIB): A novel technology for

Hitachi FB-2000A FIB, Electron Optics Facility

Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray

Applied Sciences, Free Full-Text